Dr. Alfons Burkert
at Leibniz-Institut für Photonische Technologien eV
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | December 30, 2008
Proc. SPIE. 7132, Laser-Induced Damage in Optical Materials: 2008
KEYWORDS: Silica, Luminescence, Laser scattering, Laser induced fluorescence, Raman spectroscopy, Laser irradiation, Excimer lasers, Laser damage threshold, Fusion energy, Absorption

PROCEEDINGS ARTICLE | December 20, 2007
Proc. SPIE. 6720, Laser-Induced Damage in Optical Materials: 2007
KEYWORDS: Optical components, Polishing, Luminescence, Crystals, Light scattering, Laser applications, Laser induced fluorescence, Excimer lasers, Laser crystals, Absorption

PROCEEDINGS ARTICLE | August 31, 2005
Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
KEYWORDS: Scattering, Luminescence, Light scattering, Laser scattering, Laser induced fluorescence, Laser irradiation, Laser stabilization, Excimer lasers, Excimers, Absorption

PROCEEDINGS ARTICLE | September 1, 2004
Proc. SPIE. 5459, Optical Sensing
KEYWORDS: Optical filters, Mirrors, Cameras, Quantum cascade lasers, Gas lasers, Beam shaping, Spherical lenses, Carbon monoxide, Pulsed laser operation, Absorption

PROCEEDINGS ARTICLE | November 10, 2003
Proc. SPIE. 5191, Optical Diagnostics for Fluids, Solids, and Combustion II
KEYWORDS: Silica, Argon, Particles, Luminescence, Gases, Laser induced fluorescence, Raman spectroscopy, CCD cameras, Spatial resolution, Temperature metrology

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