Dr. Alfonso Moreno
at Univ Autònoma de Barcelona
SPIE Involvement:
Publications (6)

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Metrology, Radon, Spatial frequencies, Sensors, Error analysis, Fourier transforms, Interference (communication), Finite difference methods, Deflectometry, Photonic integrated circuits

SPIE Journal Paper | 1 March 2005
OE Vol. 44 Issue 03
KEYWORDS: Fourier transforms, Optical engineering, Numerical integration, Digital filtering, Convolution, Data integration, Statistical analysis, Point spread functions, Deflectometry, Linear filtering

Proceedings Article | 14 October 2004
Proc. SPIE. 5523, Current Developments in Lens Design and Optical Engineering V
KEYWORDS: Mirrors, Polishing, Sensors, Silicon, Data acquisition, Deflectometry, Optical scanning, 3D metrology, Spatial resolution, Semiconducting wafers

Proceedings Article | 10 September 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Optical filters, Point diffraction interferometers, Fourier transforms, Interferometry, Wavefronts, LCDs, Liquid crystals, Phase measurement, Optical correlators, Phase shifts

Proceedings Article | 19 November 2003
Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life
KEYWORDS: Point spread functions, Optical filters, Digital filtering, Fourier transforms, Numerical integration, Integrated optics, Zoom lenses, Convolution, Detection theory, Data integration

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