Ali Uzun
at Tyndall National Institute
SPIE Involvement:
Author
Publications (1)

SPIE Journal Paper | 23 April 2019
JNP Vol. 13 Issue 02
KEYWORDS: Silicon carbide, Ultraviolet radiation, Photodetectors, External quantum efficiency, Nanowires, Silicon, Crystals, Scanning electron microscopy, Nanoelectronics, Optoelectronic devices

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