Dr. Allan D. Spence
Associate Professor at McMaster Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | February 24, 2005
Proc. SPIE. 5679, Machine Vision Applications in Industrial Inspection XIII
KEYWORDS: Quantum wells, Lithium, Calibration, Metals, Inspection, Head, Machine vision, Fiber reinforced polymers, Electronic imaging, Strain analysis

PROCEEDINGS ARTICLE | March 4, 2004
Proc. SPIE. 5263, Intelligent Manufacturing
KEYWORDS: Metrology, Lithium, Detection and tracking algorithms, Manufacturing, Image registration, Precision measurement, Measurement devices, Laser metrology, Sensor fusion, Digital Light Processing

PROCEEDINGS ARTICLE | December 27, 2001
Proc. SPIE. 4563, Sensors and Controls for Intelligent Manufacturing II
KEYWORDS: Human-machine interfaces, Digital signal processing, Sensors, Inspection, Amplifiers, Control systems, Intelligence systems, Analog electronics, Computer architecture, Motion controllers

Conference Committee Involvement (1)
Sensors and Controls for Intelligent Manufacturing III
29 October 2003 | Providence, RI, United States
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