Alle Meije Wink
at Univ Groningen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 May 2003 Paper
Alle Meije Wink, Jos Roerdink
Proceedings Volume 5032, (2003) https://doi.org/10.1117/12.480114
KEYWORDS: Denoising, Signal to noise ratio, Smoothing, Wavelets, Statistical analysis, Functional magnetic resonance imaging, Error analysis, Scanning probe microscopy, Fast wavelet transforms, Brain mapping

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