Dr. Allen M. Flusberg Profile

Dr. Allen M. Flusberg

Principal Research Scientist at Science Research Lab Inc

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Publications (6)

Proceedings Article | 24 February 2009 Paper

A comprehensive model of catastrophic optical-damage in broad-area laser diodes

R. Petr, M. Knapczyk, R. Bertaska, J. Jacob, I. Smilanski, A. Chin, A. Flusberg, M. Jaspan, S. Swartz

Proceedings Volume 7198, 71981A (2009) https://doi.org/10.1117/12.804834

KEYWORDS: Semiconductor lasers, Near field optics, Near field, Electroluminescence, Scanning transmission electron microscopy, Interfaces, Crystals, Laser optics, Diodes, Aluminum

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Proceedings Article | 24 February 2009 Paper

Fault protection of broad-area laser diodes

J. Jacob, A. Flusberg, S. Swartz, A. Chin, R. Petr, M. Jaspan, I. Smilanski, M. Knapczyk

Proceedings Volume 7198, 719815 (2009) https://doi.org/10.1117/12.807717

KEYWORDS: Semiconductor lasers, Near field optics, Optical resonators, Active optics, Optics manufacturing, Electronics, Diodes, High power lasers, Absorption, Laser scattering

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Proceedings Article | 16 April 2008 Paper

Thermal-to-visible transducer (TVT) for thermal-IR imaging

Allen Flusberg, Stephen Swartz, Steven Gross, Michael Huff

Proceedings Volume 6940, 694015 (2008) https://doi.org/10.1117/12.783013

KEYWORDS: Polymers, Infrared imaging, Thermography, Transducers, Semiconducting wafers, Reflectivity, Visible radiation, Staring arrays, Manufacturing, Laser beam diagnostics

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Proceedings Article | 17 May 2006 Paper

Highly sensitive infrared imager with direct optical readout

Shrenik Deliwala, Allen Flusberg

Proceedings Volume 6206, 62061E (2006) https://doi.org/10.1117/12.669353

KEYWORDS: Infrared imaging, Charge-coupled devices, Thermography, Infrared cameras, Transducers, Reflectivity, Visible radiation, Absorbance, Infrared radiation, Coating

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Proceedings Article | 13 November 1996 Paper

Localization of structural flaws from vibrational analysis

T. Luongo, Allen Flusberg, A. de Mesquita

Proceedings Volume 2946, (1996) https://doi.org/10.1117/12.259144

KEYWORDS: Bridges, Fourier transforms, Analytical research, Doppler effect, Inspection, Velocity measurements, Information operations, Defect detection, Chlorine, Data analysis

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Showing 5 of 6 publications

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