Dr. Allen Roginsky
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 August 2020 Paper
Proceedings Volume 11490, 114900W (2020) https://doi.org/10.1117/12.2568309
KEYWORDS: Modulation transfer functions, Fizeau interferometers, Calibration, Light sources, Interferometers, Spatial frequencies, Metrology, Zoom lenses, Binary data

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