Allison B. Churnside
at Univ of Colorado at Boulder
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | August 28, 2010
Proc. SPIE. 7762, Optical Trapping and Optical Micromanipulation VII
KEYWORDS: Signal to noise ratio, Microscopes, Laser scattering, Image registration, Atomic force microscopy, Optical tweezers, Laser stabilization, Image enhancement, Scanning probe microscopy, Biophysics

PROCEEDINGS ARTICLE | August 21, 2009
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Ferroelectric materials, Proteins, Calibration, Glasses, Spectroscopy, Laser scattering, Atomic force microscopy, Atomic force microscope, Molecular spectroscopy, Liquids

PROCEEDINGS ARTICLE | September 9, 2008
Proc. SPIE. 7042, Instrumentation, Metrology, and Standards for Nanomanufacturing II
KEYWORDS: Ferroelectric materials, Sensors, Calibration, Field programmable gate arrays, Atomic force microscopy, Optical tweezers, 3D metrology, Laser stabilization, Feedback loops, Scanning probe microscopy

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