Mr. Alvaro Jimenez Profile

Alvaro Jimenez

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Proceedings Article | 22 February 2011 Paper

Hyperspectral plasmonics

Dominic Lepage, Alvaro Jiménez, Jan Dubowski

Proceedings Volume 7922, 79220H (2011) https://doi.org/10.1117/12.879473

KEYWORDS: Quantum wells, Gold, Dispersion, Diffraction, Surface plasmons, Semiconductors, Dielectrics, Surface roughness, 3D metrology, Thin films

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We investigate the functioning of a monolithically integrated surface plasmon resonance (SPR) device comprising a metal coated dielectric layer deposited atop a luminescence emitting quantum well (QW) wafer. The device takes advantage of the uncollimated and incoherent emission of QWs. The light modulations in the far field, where the surface plasmons are extracted by a grating, have been calculated for a continuum of energies and wavevectors injected by the substrate. We discuss the results of our calculations based on a tensorial rigorous coupled-wave analysis aimed at the full description of SPR coupling in QW semiconductor-based architectures, designed for biosensing applications. The surface roughness induced by various nanofabrication methods is also studied, given that it is one of the main limiting factors in diffraction-based SPR sensing. This aspect is studied for thin film microstructures operating in the visible and near-infrared spectral regions. The surface roughness and dielectric values for various deposition rates of very thin Au films are examined. We finally introduce a novel experimental method for direct mapping of the electromagnetic (EM) wave dispersion that enabled us monitoring of a massive amount of light-scattering related information. We present the results of far field measurements of the complete 3D dispersion relation of a SPR effect induced by this nanodevice. The quasi-real time method is applied for tracking SPR directly in the E(k) space. Those additional dimensions, measured with scalable tracking precision, reveal anisotropic surficial interactions and provide spectroscopic response for SPR.

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