Dr. Amardeep Kaur Profile

Dr. Amardeep Kaur

Associate Professor at Southern Illinois Univ Edwardsville

SPIE Involvement:

Author

Area of Expertise:

Optical Fiber Sensing , Smart Structure Sensing , Non Destructive Testing , Engineering Education

Websites:

Personal Website | Company Website

PhD Missouri University of Science and Technology, Rolla, Missouri (formerly, University of Missouri - Rolla) 2014
MS Missouri University of Science and Technology, Rolla, Missouri 2009

Assistant Teaching Professor, Electrical and Computer Engineering, Missouri University of Science and Technology

Memberships:
Member, SPIE
Member, IEEE
Member, Sigma Xi
Member, SWE
Member, ASEE; Officer of the Midwest Section (2016 - ongoing)

Publications: 18 journal, proceedings and other publications

Proceedings Article | 18 April 2023 Paper

Real-time surface damage analysis of concrete structures using Python-based image analysis

Shivam Jha, Amardeep Kaur

Proceedings Volume 12487, 1248717 (2023) https://doi.org/10.1117/12.2657553

KEYWORDS: Image segmentation, Image analysis, Education and training, Image processing, Edge detection, Algorithm development, Machine learning, Object detection

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Proceedings Article | 27 March 2018 Paper

Strain monitoring using distributed fiber optic sensors embedded in carbon fiber composites

Sasi Jothibasu, Yang Du, Sudharshan Anandan, Gurjot Dhaliwal, Amardeep Kaur, Steve Watkins, K. Chandrashekhara, Jie Huang

Proceedings Volume 10598, 105980I (2018) https://doi.org/10.1117/12.2296636

KEYWORDS: Composites, Sensors, Fiber optics sensors, Temperature metrology, Optical fibers, Spatial resolution, Data acquisition, Carbon, Optical sensing, Structural health monitoring

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Proceedings Article | 20 April 2016 Presentation + Paper

Monitoring cure properties of out-of-autoclave BMI composites using IFPI sensor

Amardeep Kaur, Sudharshan Anandan, Lei Yuan, Steve Watkins, K. Chandrashekhara, Hai Xiao, Nam Phan

Proceedings Volume 9803, 98031Z (2016) https://doi.org/10.1117/12.2219492

KEYWORDS: Composites, Sensors, Fiber optics sensors, Manufacturing, Femtosecond phenomena, Aerospace engineering, Epoxies, Temperature metrology, Single mode fibers, Optical fibers, Structured optical fibers

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Proceedings Article | 20 April 2016 Paper

Strain monitoring of a composite wing

Joseph Strathman, Steve Watkins, Amardeep Kaur, David Macke

Proceedings Volume 9803, 980346 (2016) https://doi.org/10.1117/12.2219363

KEYWORDS: Composites, Fiber optics sensors, Sensors, Unmanned aerial vehicles, Rayleigh scattering, Fiber optics tests, Fiber optics, Smart structures, Carbon, Optical fibers

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SPIE Journal Paper | 8 March 2016 Open Access

Strain monitoring of bismaleimide composites using embedded microcavity sensor

Amardeep Kaur, Sudharshan Anandan, Lei Yuan, Steve Watkins, K. Chandrashekhara, Hai Xiao, Nam Phan

OE, Vol. 55, Issue 03, 037102, (March 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.3.037102

KEYWORDS: Sensors, Composites, Optical microcavities, Brain-machine interfaces, Fiber optics sensors, Temperature metrology, Optical fibers, Silica, Carbon, Interferometers

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SPIE Journal Paper | 24 January 2014 Open Access

Microcavity strain sensor for high temperature applications

Amardeep Kaur, Steve Watkins, Jie Huang, Lei Yuan, Hai Xiao

OE, Vol. 53, Issue 01, 017105, (January 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.1.017105

KEYWORDS: Sensors, Optical microcavities, Single mode fibers, Interferometry, Micromachining, Femtosecond phenomena, Fusion splicing, Optical fibers, Calibration, Silica

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Proceedings Article | 19 April 2013 Paper

Embeddable fiber optic strain sensor for structural monitoring

Amardeep Kaur, Sriram Nagarajan, Sudharshan Anandan, Lei Yuan, K. Chandrashekhara, Steve Watkins, Hai Xiao, Nam Phan

Proceedings Volume 8692, 86921W (2013) https://doi.org/10.1117/12.2009462

KEYWORDS: Sensors, Fiber optics sensors, Composites, Carbon, Temperature metrology, Optical fibers, Fabry–Perot interferometers, Fusion splicing, Silica, Brain-machine interfaces

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Proceedings Article | 16 April 2013 Paper

Monitoring of out-of-autoclave BMI composites using fiber optic sensors

Sudharshan Anandan, Sriram Nagarajan, Amardeep Kaur, K. Chandrashekhara, Hai Xiao

Proceedings Volume 8694, 86940M (2013) https://doi.org/10.1117/12.2009873

KEYWORDS: Composites, Sensors, Brain-machine interfaces, Fiber optics sensors, Manufacturing, Optical fibers, Carbon, Fabry–Perot interferometry, Optical sensors, Femtosecond phenomena

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SPIE Journal Paper | 4 January 2013

Reflection-based phase-shifted long period fiber grating for simultaneous measurement of temperature and refractive index

Jie Huang, Xinwei Lan, Amardeep Kaur, Hanzheng Wang, Lei Yuan, Hai Xiao

OE, Vol. 52, Issue 01, 014404, (January 2013) https://doi.org/10.1117/12.10.1117/1.OE.52.1.014404

KEYWORDS: Temperature metrology, Sensors, Signal attenuation, Gas lasers, Refractive index, Phase shifts, Cladding, Polishing, Carbon monoxide, Liquids

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Proceedings Article | 30 March 2009 Paper

Vehicle positioning using image processing

Amardeep Kaur, Steve Watkins, Theresa Swift

Proceedings Volume 7292, 72922G (2009) https://doi.org/10.1117/12.815321

KEYWORDS: Bridges, Image processing, Cameras, Target detection, Sensors, Detection and tracking algorithms, MATLAB, Hough transforms, Smart structures, Distance measurement

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Showing 5 of 10 publications

Course Instructor

NON-SPIE: Electrical Circuits for Non-EE Majors (EE2800)

AC circuits with DC circuits as a special case. Poly-phase circuit analysis and applications like inductor motors, transformers and filters.

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NON-SPIE: Circuits - II (EE2120)

Analysis of steady state AC circuits, polyphase circuits, complex frequency and frequency response, magnetically coupled circuits.

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NON-SPIE: Introduction to Electronic Devices (EE2200)

Materials and device structures for applications in analog and digital electronics. Topics include characteristics and basic circuits for diodes, field-effect transistors, bipolar junction transistors, and operational amplifiers.

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NON-SPIE: Introduction to Micro-Controllers and Embedded System Design (CpE3150)

Microcontroller-based digital system design methodology and techniques. Topics include basic machine organization, interface design, and C and assembly language programming for real-time embedded systems.

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NON-SPIE: Electronic - I (EE3100)

Diode and transistor circuits, small signal analysis, amplifier design, differential and operational amplifiers, flipflop circuits and wave-shaping.

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NON-SPIE: Introduction to Digital Logic (CpE2210)

Binary arithmetic, Boolean algebra, logic and memory elements, computer organization, State Machines.

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