Dr. Amber M. Beckley Profile

Dr. Amber M. Beckley

Postdoctoral Fellow at Ecole Polytechnique de Montréal

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Publications (6)

SPIE Journal Paper | 17 December 2015 Open Access

Toward an automated method for optical coherence tomography characterization

Mathias Strupler, Amber Beckley, Fouzi Benboujja, Sylvain Dubois, Isabelle Noiseux, Ozzy Mermut, Jean-Pierre Bouchard, Caroline Boudoux

JBO, Vol. 20, Issue 12, 126007, (December 2015) https://doi.org/10.1117/12.10.1117/1.JBO.20.12.126007

KEYWORDS: Optical coherence tomography, Calibration, Mirrors, Interfaces, Signal to noise ratio, Reflectivity, Tissues, Imaging systems, Aluminum, Distortion

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Proceedings Article | 3 February 2012 Paper

Star test polarimetry using stress-engineered optical elements

Roshita Ramkhalawon, Amber Beckley, Thomas Brown

Proceedings Volume 8227, 82270Q (2012) https://doi.org/10.1117/12.908472

KEYWORDS: Polarization, Point spread functions, Polarimetry, Optical components, Stars, Calibration, Imaging systems, Image processing, Microscopy, Glasses

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Proceedings Article | 25 October 2011 Paper

Full Poincaré beams

Miguel Alonso, Amber Beckley, Thomas Brown

Proceedings Volume 8011, 80111M (2011) https://doi.org/10.1117/12.903258

KEYWORDS: Polarization, Optical spheres, Superposition, Beam propagation method, Wave plates, Birefringence, Radio propagation, Laser scattering, Scattering, Particles

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Proceedings Article | 9 September 2010 Paper

Imprinting aberrations in the Stokes parameters of a focal spot

Amber Beckley, Thomas Brown

Proceedings Volume 7652, 76521V (2010) https://doi.org/10.1117/12.869058

KEYWORDS: Point spread functions, Polarization, Monochromatic aberrations, Optical components, Wavefront aberrations, Apodization, Birefringence, Optical filters, Inspection, Imaging systems

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Proceedings Article | 25 February 2010 Paper

Pupil polarimetry using stress-engineered optical elements

Amber Beckley, Thomas Brown

Proceedings Volume 7570, 757011 (2010) https://doi.org/10.1117/12.848970

KEYWORDS: Polarization, Polarimetry, Optical components, Genetic algorithms, Imaging systems, Apodization, Spiral phase plates, Bismuth, Charge-coupled devices, Optical testing

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