Dr. Amber L. Dagel
Senior Member of the Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III
KEYWORDS: Defense and security, Phase contrast, X-rays, Inspection, Nondestructive evaluation, Synchrotrons, Reconstruction algorithms, Algorithm development, X-ray imaging, Absorption

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III
KEYWORDS: Phase contrast, Foam, Defect detection, X-rays, Inspection, Nondestructive evaluation, Tomography, Synchrotrons, X-ray imaging, Defect inspection

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Optical design, Prisms, Computational imaging, Imaging systems

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Computational imaging, Imaging systems, Scattering, Calibration, Image restoration, 3D printing

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Optical design, Computational imaging, Computer simulations, Tolerancing

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10222, Computational Imaging II
KEYWORDS: Optical components, Computational imaging, Imaging systems, Sensors, Calibration, Image processing, Computing systems, Computer simulations, Image quality, Image sensors, Algorithm development, Prototyping, 3D image processing

Showing 5 of 9 publications
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