Dr. Amber L. Dagel
Senior Member of the Technical Staff at Sandia National Labs
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | September 7, 2018
Proc. SPIE. 10751, Optics and Photonics for Information Processing XII
KEYWORDS: Optical components, Prisms, Image compression, Imaging systems, Sensors, Matrices, Neural networks, Optimization (mathematics), Classification systems

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III
KEYWORDS: Defense and security, Phase contrast, X-rays, Inspection, Nondestructive evaluation, Synchrotrons, Reconstruction algorithms, Algorithm development, X-ray imaging, Absorption

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10632, Anomaly Detection and Imaging with X-Rays (ADIX) III
KEYWORDS: Phase contrast, Foam, Defect detection, X-rays, Inspection, Nondestructive evaluation, Tomography, Synchrotrons, X-ray imaging, Defect inspection

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Optical design, Prisms, Computational imaging, Imaging systems

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Optical design, Computational imaging, Computer simulations, Tolerancing

PROCEEDINGS ARTICLE | November 27, 2017
Proc. SPIE. 10590, International Optical Design Conference 2017
KEYWORDS: Computational imaging, Imaging systems, Scattering, Calibration, Image restoration, 3D printing

Showing 5 of 10 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top