Ameneh Bostani
M.Sc. Student at Ecole Polytechnique de Montréal
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 June 2009
Proc. SPIE. 7390, Modeling Aspects in Optical Metrology II
KEYWORDS: Optical transfer functions, Spatial frequencies, Sensors, Phase shift keying, Printing, Ronchi rulings, Transmittance, Convolution, Modulation transfer functions, Phase transfer function

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