Dr. Ameng Li
at Shenzhen Academy of Metrology & Quality Inspection
SPIE Involvement:
Publications (14)

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Imaging systems, Calibration, Optical imaging, Charge-coupled devices, Inspection, Optical testing, Standards development, Statistical analysis, Metrology, Analytical research

Proceedings Article | 1 May 2014
Proc. SPIE. 9132, Optical Micro- and Nanometrology V
KEYWORDS: Calibration, 3D modeling, Imaging systems, 3D metrology, 3D image processing, Stereoscopy, Systems modeling, Microscopy, Optical metrology, Distortion

Proceedings Article | 19 December 2013
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: 3D modeling, Cameras, 3D image processing, Calibration, Image registration, Imaging systems, Volume rendering, Systems modeling, Light sources and illumination, 3D acquisition

Proceedings Article | 26 September 2013
Proc. SPIE. 8856, Applications of Digital Image Processing XXXVI
KEYWORDS: Stereoscopy, 3D image processing, Data acquisition, Fringe analysis, Phase shifting, Demodulation, Fourier transforms, 3D acquisition, Real time imaging, Structured light

Proceedings Article | 20 November 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Cameras, Speckle pattern, 3D metrology, Speckle, Phase shifts, Projection systems, Calibration, Imaging systems, Computing systems, 3D modeling

Showing 5 of 14 publications
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