Dr. Amit Suratkar
at
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 14, 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Wafer-level optics, Refractive index, Interferometers, Error analysis, Silicon, Reflectivity, Interferometry, Reflectometry, Charge-coupled devices, Semiconducting wafers

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Refractive index, Silica, Interferometers, Calibration, Error analysis, Fourier transforms, Interferometry, Uncertainty analysis, Distance measurement, Temperature metrology

PROCEEDINGS ARTICLE | September 14, 2007
Proc. SPIE. 6671, Optical Manufacturing and Testing VII
KEYWORDS: Refractive index, Mirrors, Light sources, Fringe analysis, Opacity, Interferometers, Interferometry, Phase interferometry, Distance measurement, Neodymium

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top