Dr. Amit Suratkar
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 14 September 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Wafer-level optics, Refractive index, Interferometers, Error analysis, Silicon, Reflectivity, Interferometry, Reflectometry, Charge-coupled devices, Semiconducting wafers

Proceedings Article | 11 August 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Refractive index, Silica, Interferometers, Calibration, Error analysis, Fourier transforms, Interferometry, Uncertainty analysis, Distance measurement, Temperature metrology

Proceedings Article | 14 September 2007
Proc. SPIE. 6671, Optical Manufacturing and Testing VII
KEYWORDS: Refractive index, Mirrors, Light sources, Fringe analysis, Opacity, Interferometers, Interferometry, Phase interferometry, Distance measurement, Neodymium

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