Anastasia Y. Tyurina
President at Second Star Algonumerix LLC
SPIE Involvement:
Publications (10)

Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Optical components, Optical design, X-ray optics, Metrology, Statistical analysis, Data modeling, X-rays, Linear filtering, Spatial resolution, Stochastic processes

PROCEEDINGS ARTICLE | September 8, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical transfer functions, Point spread functions, Mirrors, Metrology, Data modeling, X-rays, Modulation transfer functions, Electronic filtering, Stochastic processes, Surface finishing

SPIE Journal Paper | July 15, 2016
OE Vol. 55 Issue 07
KEYWORDS: Data modeling, Autoregressive models, Metrology, Stochastic processes, Mirrors, X-rays, Polishing, X-ray optics, Surface finishing, Algorithm development

PROCEEDINGS ARTICLE | November 30, 2015
Proc. SPIE. 9809, Twelfth International Conference on Correlation Optics
KEYWORDS: Mirrors, X-ray optics, Polishing, Metrology, Data modeling, X-rays, Algorithm development, Stochastic processes, Autoregressive models, Statistical modeling

SPIE Journal Paper | August 6, 2014
OE Vol. 53 Issue 08
KEYWORDS: Autoregressive models, Data modeling, Metrology, X-ray optics, Linear filtering, Mathematical modeling, Stochastic processes, Reverse modeling, Statistical analysis, Mirrors

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8848, Advances in X-Ray/EUV Optics and Components VIII
KEYWORDS: Mathematical modeling, Mirrors, X-ray optics, Metrology, Statistical analysis, Data modeling, Linear filtering, Stochastic processes, Autoregressive models, Reverse modeling

Showing 5 of 10 publications
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