Anastasia Y. Tyurina
President at Second Star Algonumerix LLC
SPIE Involvement:
Publications (11)

SPIE Journal Paper | 9 August 2019
OE Vol. 58 Issue 08
KEYWORDS: Data modeling, Stochastic processes, Metrology, Mirrors, Autoregressive models, Polishing, Surface finishing, X-ray optics, X-rays, Statistical analysis

Proceedings Article | 23 August 2017
Proc. SPIE. 10388, Advances in Computational Methods for X-Ray Optics IV
KEYWORDS: Optical components, Optical design, X-ray optics, Metrology, Statistical analysis, Data modeling, X-rays, Linear filtering, Spatial resolution, Stochastic processes

Proceedings Article | 8 September 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Optical transfer functions, Point spread functions, Mirrors, Metrology, Data modeling, X-rays, Modulation transfer functions, Electronic filtering, Stochastic processes, Surface finishing

SPIE Journal Paper | 15 July 2016
OE Vol. 55 Issue 07
KEYWORDS: Data modeling, Autoregressive models, Metrology, Stochastic processes, Mirrors, X-rays, Polishing, X-ray optics, Surface finishing, Algorithm development

Proceedings Article | 30 November 2015
Proc. SPIE. 9809, Twelfth International Conference on Correlation Optics
KEYWORDS: Mirrors, X-ray optics, Polishing, Metrology, Data modeling, X-rays, Algorithm development, Stochastic processes, Autoregressive models, Statistical modeling

Showing 5 of 11 publications
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