André Fischer
at TU Dresden
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 March 2013
Proc. SPIE. 8665, Media Watermarking, Security, and Forensics 2013
KEYWORDS: Cameras, Sensors, Databases, Image segmentation, Forensic science, Distortion, Vignetting, Geometrical optics, Optical aberrations, Instrument modeling

Proceedings Article | 24 March 2009
Proc. SPIE. 7272, Metrology, Inspection, and Process Control for Microlithography XXIII
KEYWORDS: Lithography, Metrology, Modulation, Inspection, Finite element methods, Design for manufacturing, Optical proximity correction, SRAF, Semiconducting wafers, Defect inspection

Proceedings Article | 4 March 2008
Proc. SPIE. 6925, Design for Manufacturability through Design-Process Integration II
KEYWORDS: Lithography, Optical transfer functions, Metrology, Scanning electron microscopy, Finite element methods, Photomasks, Optical proximity correction, Computer aided design, Semiconducting wafers, Defect inspection

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