Andrea Buratti
at RWTH Aachen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 October 2016 Presentation + Paper
A. Buratti, M. Ferrucci, S. Ben Achour, W. Dewulf, R. Schmitt
Proceedings Volume 9967, 99671C (2016) https://doi.org/10.1117/12.2240566
KEYWORDS: Computed tomography, Testing and analysis, 3D metrology, X-ray computed tomography, Dimensional metrology, Edge detection, X-rays, Sensors, Signal attenuation, Aluminum

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