Dr. Andreas Amann
at Tyndall National Institute
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | March 27, 2015
Proc. SPIE. 9423, Alternative Lithographic Technologies VII
KEYWORDS: Lithography, Statistical analysis, Error analysis, Silicon, Image analysis, Scanning electron microscopy, Dimensional metrology, Directed self assembly, Optical alignment, Imaging arrays

PROCEEDINGS ARTICLE | May 28, 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Lithography, Statistical analysis, Annealing, Error analysis, Silicon, Image analysis, Scanning electron microscopy, Directed self assembly, Picosecond phenomena, Optical alignment

PROCEEDINGS ARTICLE | April 2, 2014
Proc. SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII
KEYWORDS: Statistical analysis, Polymers, Annealing, Silicon, Image analysis, Scanning electron microscopy, Software development, Directed self assembly, Picosecond phenomena, Optical alignment

PROCEEDINGS ARTICLE | April 28, 2010
Proc. SPIE. 7720, Semiconductor Lasers and Laser Dynamics IV
KEYWORDS: Bistability, Optical components, Modeling, Switches, Switching, Semiconductor lasers, Laser resonators, Integrated optics, Optical storage, Laser optics

PROCEEDINGS ARTICLE | April 21, 2008
Proc. SPIE. 6989, Photonic Crystal Materials and Devices VIII
KEYWORDS: Refractive index, Fiber Bragg gratings, Dispersion, Dielectrics, Complex systems, Physics, Solitons, Photonic crystals, Geometrical optics, Maxwell's equations

PROCEEDINGS ARTICLE | June 13, 2007
Proc. SPIE. 6603, Noise and Fluctuations in Photonics, Quantum Optics, and Communications
KEYWORDS: Optical spheres, Polymethylmethacrylate, Crystals, Light scattering, Photonic crystals, Scanning electron microscopy, Acoustics, Photomicroscopy, Stochastic processes, Data analysis

Showing 5 of 8 publications
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