Dr. Andreas Amann
at Tyndall National Institute
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 27 March 2015
Proc. SPIE. 9423, Alternative Lithographic Technologies VII
KEYWORDS: Lithography, Statistical analysis, Error analysis, Silicon, Image analysis, Scanning electron microscopy, Dimensional metrology, Directed self assembly, Optical alignment, Imaging arrays

Proceedings Article | 28 May 2014
Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III
KEYWORDS: Lithography, Statistical analysis, Annealing, Error analysis, Silicon, Image analysis, Scanning electron microscopy, Directed self assembly, Picosecond phenomena, Optical alignment

Proceedings Article | 2 April 2014
Proc. SPIE. 9050, Metrology, Inspection, and Process Control for Microlithography XXVIII
KEYWORDS: Statistical analysis, Polymers, Annealing, Silicon, Image analysis, Scanning electron microscopy, Software development, Directed self assembly, Picosecond phenomena, Optical alignment

Proceedings Article | 28 April 2010
Proc. SPIE. 7720, Semiconductor Lasers and Laser Dynamics IV
KEYWORDS: Bistability, Optical components, Modeling, Switches, Switching, Semiconductor lasers, Laser resonators, Integrated optics, Optical storage, Laser optics

Proceedings Article | 21 April 2008
Proc. SPIE. 6989, Photonic Crystal Materials and Devices VIII
KEYWORDS: Refractive index, Fiber Bragg gratings, Dispersion, Dielectrics, Complex systems, Physics, Solitons, Photonic crystals, Geometrical optics, Maxwell's equations

Showing 5 of 8 publications
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