Dr. Andreas Breitbarth
Postdoctoral research fellow at Technische Universität Ilmenau
SPIE Involvement:
Author
Area of Expertise:
optical 3D measurements , measurements of moving objects , fringe projection
Websites:
Publications (7)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Imaging systems, Sensors, Inspection, Optical inspection, Solids, 3D metrology, Motion measurement, Motion estimation, 3D image processing

PROCEEDINGS ARTICLE | May 1, 2017
Proc. SPIE. 10220, Dimensional Optical Metrology and Inspection for Practical Applications VI
KEYWORDS: Optical filters, Optical spheres, Calibration, 3D modeling, 3D metrology, Projection systems, Translucency

PROCEEDINGS ARTICLE | May 14, 2015
Proc. SPIE. 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV
KEYWORDS: Prisms, Optical spheres, Imaging systems, Cameras, Sensors, Image segmentation, 3D metrology, Projection systems, Electroluminescent displays, 3D image processing

SPIE Journal Paper | June 6, 2014
OE Vol. 53 Issue 11
KEYWORDS: Sensors, Cameras, Projection systems, Distortion, 3D metrology, Calibration, 3D acquisition, Image compression, Photography, Optical sensors

PROCEEDINGS ARTICLE | May 23, 2013
Proc. SPIE. 8791, Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection
KEYWORDS: Fringe analysis, Phase shifting, Cameras, Clouds, 3D modeling, 3D metrology, Light sources and illumination, Motion measurement, Motion estimation, 3D image processing

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Fringe analysis, Light emitting diodes, Microlens array, Cameras, 3D metrology, Projection systems, Semiconducting wafers, Prototyping, Digital Light Processing, 3D image processing

Showing 5 of 7 publications
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