Prof. Andreas Ettemeyer
Prorektor at NTB Interstaatliche Hochschule für Technik Buchs
SPIE Involvement:
Author
Publications (31)

Proceedings Article | 6 December 2016
Proc. SPIE. 10014, Laser-Induced Damage in Optical Materials 2016
KEYWORDS: Optical components, Antireflective coatings, Silica, Laser induced damage, Ultraviolet radiation, Optical coatings, Optical testing, Laser irradiation, Laser damage threshold, Temperature metrology

Proceedings Article | 23 November 2015
Proc. SPIE. 9632, Laser-Induced Damage in Optical Materials: 2015
KEYWORDS: Multilayers, Polishing, Silica, Sputter deposition, Laser induced damage, Manufacturing, Optical coatings, Ion beams, Laser damage threshold, Optics manufacturing

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Optical filters, Light sources, Lenses, Sensors, Ultraviolet radiation, Interference (communication), Distance measurement, Optical simulations, Charge-coupled devices, Signal detection

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Light emitting diodes, Imaging systems, Cameras, Calibration, Inspection, Image acquisition, 3D metrology, Projection systems, Semiconducting wafers, Content addressable memory

Proceedings Article | 31 January 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Microscopes, 3D acquisition, Digital holography, Microscopy, Inspection, Image acquisition, Wavefronts, Molybdenum, Semiconducting wafers, 3D image processing

SPIE Journal Paper | 14 May 2012
OE Vol. 51 Issue 8
KEYWORDS: Sensors, Cameras, Optical spheres, Interferometers, Fiber lasers, Light sources, 3D metrology, Optical sensors, Microscopes, Confocal microscopy

Showing 5 of 31 publications
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