Dr. Andreas Tortschanoff
at Silicon Austria Labs GmbH
SPIE Involvement:
Author
Publications (28)

Proceedings Article | 3 October 2019
Proc. SPIE. 11207, Fourth International Conference on Applications of Optics and Photonics
KEYWORDS: Refractive index, Optical spheres, Waveguides, Cladding, Sensors, Particles, Silicon, 3D modeling, Finite element methods, Mie scattering

Proceedings Article | 21 February 2019
Proc. SPIE. 10883, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI
KEYWORDS: Microscopes, Diffraction, Point spread functions, Imaging systems, Calibration, Image segmentation, Image processing, Composites, 3D modeling, Systems modeling

Proceedings Article | 21 February 2019
Proc. SPIE. 10883, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI
KEYWORDS: Optical components, Microscopes, 3D image reconstruction, Sensors, Calibration, Microscopy, Luminescence, 3D modeling, Reconstruction algorithms, 3D image processing

SPIE Journal Paper | 12 December 2017
OE Vol. 56 Issue 12
KEYWORDS: Laser induced breakdown spectroscopy, Spectrometers, Diodes, Solid state lasers, Diode pumped solid state lasers, Laser sources, Statistical analysis, Nd:YAG lasers, Chemical analysis, Carbon

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Laser sources, Q switching, High power lasers, Spectrometers, Laser development, Nd:YAG lasers, Diodes, Laser induced breakdown spectroscopy, Chemical analysis, Q switched lasers, Diode pumped solid state lasers

Showing 5 of 28 publications
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