Dr. Andrei Brunfeld
Senior Staff Scientist at Seagate Technology LLC
SPIE Involvement:
Senior status | Author
Publications (6)

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Mirrors, Fabry–Perot interferometers, Resonators, Scattering, Interferometers, Inspection, Laser scattering, Interferometry, Head, Surface finishing

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Signal to noise ratio, Microscopes, Photodetectors, Diffraction, Polarization, Microscopy, Inspection, Interference (communication), Objectives, Signal detection

PROCEEDINGS ARTICLE | June 20, 2002
Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis
KEYWORDS: Diffraction, Gaussian beams, Sensors, Reflectivity, Interferometry, Optical testing, Transform theory, Reconstruction algorithms, Signal detection, Near field optics

PROCEEDINGS ARTICLE | June 20, 2002
Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis
KEYWORDS: Statistical analysis, Sensors, Inspection, Surface roughness, Fourier transforms, Wavefronts, Atomic force microscopy, Optical testing, Laser scanners, Surface finishing

PROCEEDINGS ARTICLE | March 11, 1996
Proc. SPIE. 2651, Liquid Crystal Materials, Devices, and Applications IV
KEYWORDS: Defect detection, Interferometers, Sensors, Calibration, Glasses, Inspection, Interferometry, LCDs, Signal detection, Beam analyzers

PROCEEDINGS ARTICLE | July 1, 1990
Proc. SPIE. 1319, Optics in Complex Systems

Showing 5 of 6 publications
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