Dr. Andrei V. Osinsky
CEO at Agnitron Technology Inc
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 February 2017
Proc. SPIE. 10105, Oxide-based Materials and Devices VIII
KEYWORDS: Thin films, Photodetectors, Electrodes, Ultraviolet radiation, Crystals, Surface roughness, Platinum, Atomic force microscopy, Transmission electron microscopy, Sapphire, Diodes, Aluminum nitride, Laser crystals, Zinc oxide, Molecular beam epitaxy, Thin film growth

Proceedings Article | 24 February 2017
Proc. SPIE. 10105, Oxide-based Materials and Devices VIII
KEYWORDS: Thin films, Photodetectors, External quantum efficiency, Ultraviolet radiation, Germanium, Quantum efficiency, Photodiodes, Oxygen, Diodes, Silicon carbide, Missiles, Metalorganic chemical vapor deposition, Temperature metrology, Tin

Proceedings Article | 27 February 2016
Proc. SPIE. 9749, Oxide-based Materials and Devices VII
KEYWORDS: Thin films, Photodetectors, Magnesium, Spectroscopy, Crystals, Interfaces, Chemical vapor deposition, Atomic force microscopy, Sapphire, Transmittance, Aluminum nitride, Zinc oxide, Metalorganic chemical vapor deposition, Vapor phase epitaxy, Absorption

Proceedings Article | 7 September 2006
Proc. SPIE. 6294, Infrared and Photoelectronic Imagers and Detector Devices II
KEYWORDS: Silicon, Resistance, Photodiodes, Gallium nitride, Sapphire, Diodes, Silicon carbide, PIN photodiodes, Thermal modeling, Temperature metrology

Proceedings Article | 3 March 2006
Proc. SPIE. 6121, Gallium Nitride Materials and Devices
KEYWORDS: Electron beams, Magnesium, Iron, Diffusion, Gallium nitride, Ionization, Aluminum, Manganese, Gallium, Temperature metrology

Showing 5 of 8 publications
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