Dr. Andrei Tkachuk
Engineering Manager at Carl Zeiss X-ray Microscopy Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | September 18, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Microscopes, Stereoscopy, Polymers, Crystals, X-rays, X-ray microscopy, Image resolution, Synchrotrons, X-ray imaging, 3D image processing

PROCEEDINGS ARTICLE | September 7, 2006
Proc. SPIE. 6318, Developments in X-Ray Tomography V
KEYWORDS: Microscopes, Phase contrast, X-rays, Copper, Silicon, Tomography, Objectives, Zone plates, X-ray imaging, X-ray detectors

PROCEEDINGS ARTICLE | November 3, 2004
Proc. SPIE. 5537, X-Ray Sources and Optics
KEYWORDS: Polishing, Etching, Crystals, X-rays, X-ray diffraction, Silicon, Monochromators, X-ray imaging, Surface finishing, Chemical mechanical planarization

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