Andrew Nixon
at BAE Systems
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Proceedings Volume 11059, 110590E (2019) https://doi.org/10.1117/12.2527622
KEYWORDS: Principal component analysis, Inspection, Ultrasonics, Defect detection, Nondestructive evaluation, Data acquisition, Structural engineering, Phased arrays, Image processing, Statistical analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top