Mr. Andrew Voshell
Undergraduate at
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10381, Wide Bandgap Power Devices and Applications II
KEYWORDS: Thin films, Refractive index, Capacitors, Polarization, Sputter deposition, Scanning electron microscopy, Transmittance, Aluminum, pyroelectric detectors, Temperature metrology

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Bolometers, Microbolometers, Semiconductors, Thin films, Silicon films, Infrared radiation

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Infrared sensors, Sputter deposition, Silicon, Aluminum, Aluminum nitride, pyroelectric detectors, Infrared detection, Dielectric polarization, Temperature metrology

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10209, Image Sensing Technologies: Materials, Devices, Systems, and Applications IV
KEYWORDS: Sputter deposition, Crystals, pyroelectric detectors, Pyroelectricity, Temperature metrology

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