Andrey A. Lomov
at Institute of Physics and Technology of the RAS
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 30 December 2016
Proc. SPIE. 10224, International Conference on Micro- and Nano-Electronics 2016
KEYWORDS: Annealing, Crystals, X-rays, Ions, Silicon, Reflectivity, Atomic force microscopy, Transmission electron microscopy, Helium, Plasma

Proceedings Article | 8 January 2013
Proc. SPIE. 8700, International Conference Micro- and Nano-Electronics 2012
KEYWORDS: Diffraction, Reflection, Scattering, Etching, Crystals, X-rays, X-ray diffraction, Gallium arsenide, Scanning electron microscopy, Transmission electron microscopy

Proceedings Article | 10 June 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Quantum wells, Second-harmonic generation, Spectroscopy, X-rays, Interfaces, Silicon, Interferometry, Reflectometry, Geometrical optics, Anisotropy

Proceedings Article | 10 June 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Diffraction, Quantum wells, Data modeling, Scattering, Chemical species, Crystals, X-rays, X-ray diffraction, Heterojunctions, Crystallography

Proceedings Article | 10 June 2006
Proc. SPIE. 6260, Micro- and Nanoelectronics 2005
KEYWORDS: Diffraction, Quantum wells, Scattering, Luminescence, Crystals, X-rays, X-ray diffraction, Interfaces, Gallium arsenide, Heterojunctions

Showing 5 of 6 publications
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