Dr. Andrey A. Sokolov
at Helmholtz-Zentrum Berlin
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | 8 October 2020
JATIS Vol. 6 Issue 04

Proceedings Article | 21 August 2020 Presentation + Paper
Proc. SPIE. 11493, Advances in Computational Methods for X-Ray Optics V
KEYWORDS: Energy efficiency, Diffraction, Optical design, X-rays, Imaging spectroscopy, Neodymium, Grazing incidence, Polarizability, Diffraction gratings

Proceedings Article | 7 September 2017 Paper
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Carbon, Optical components, X-ray optics, Metrology, Contamination, X-rays, Reflectivity, Reflectometry, Synchrotron radiation, Scanning tunneling microscopy

Proceedings Article | 5 September 2014 Paper
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Optical components, Mirrors, Metrology, Sensors, Reflectivity, Reflectometry, Collimation, Extreme ultraviolet, Monochromators, Diffraction gratings

Proceedings Article | 5 September 2014 Paper
Proc. SPIE. 9206, Advances in Metrology for X-Ray and EUV Optics V
KEYWORDS: Optical components, Mirrors, Metrology, LabVIEW, Polarization, Sensors, Reflectivity, Reflectometry, Extreme ultraviolet, Monochromators

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