Dr. Andries J. Scholten
at NXP Semiconductors N.V.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 May 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Data modeling, Resistance, Solids, Transistors, Field effect transistors, CMOS technology, Molybdenum, Radio frequency circuits, Thermal modeling, Instrument modeling

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top