Prof. Angarai R. Ganesan
Associate Professor at Indian Institute of Technology Madras
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (12)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Convection, Mach-Zehnder interferometers, Visualization, Interferometry, Cooling equipment, Copper, Temperature metrology, Helium neon lasers

PROCEEDINGS ARTICLE | August 28, 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Wavefront sensors, Interferometers, Interferometry, Quality measurement, Metrology, Michelson interferometers, Monochromatic aberrations, Wavefronts, Mirrors, Beam splitters

SPIE Journal Paper | August 9, 2016
OE Vol. 55 Issue 08
KEYWORDS: Mirrors, Interferometers, Beam splitters, Reflection, Michelson interferometers, Collimation, Interferometry, Optical engineering, Wavefronts, Turbulence

SPIE Journal Paper | July 23, 2015
OE Vol. 54 Issue 07
KEYWORDS: Tolerancing, Monochromatic aberrations, Wavefronts, Photovoltaics, Wavefront sensors, Optical components, Optical testing, Optical engineering, Ray tracing, Wavefront reconstruction

PROCEEDINGS ARTICLE | March 17, 2015
Proc. SPIE. 9417, Medical Imaging 2015: Biomedical Applications in Molecular, Structural, and Functional Imaging
KEYWORDS: Breast, Tissues, Tumors, Finite element methods, Speckle pattern, Interferometry, Breast cancer, Ultrasonography, Mammography, Biomedical optics

SPIE Journal Paper | September 19, 2014
OE Vol. 53 Issue 11
KEYWORDS: Holography, Holographic interferometry, Microscopy, Digital holography, Physics, 3D displays, Metrology, Nondestructive evaluation, LCDs, Computing systems

Showing 5 of 12 publications
Conference Committee Involvement (2)
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
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