Prof. Angarai R. Ganesan
Associate Professor at Indian Institute of Technology Madras
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (12)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Mach-Zehnder interferometers, Visualization, Copper, Interferometry, Convection, Helium neon lasers, Cooling equipment, Temperature metrology

PROCEEDINGS ARTICLE | August 28, 2016
Proc. SPIE. 9960, Interferometry XVIII
KEYWORDS: Monochromatic aberrations, Mirrors, Beam splitters, Metrology, Interferometers, Interferometry, Wavefront sensors, Wavefronts, Quality measurement, Michelson interferometers

SPIE Journal Paper | August 9, 2016
OE Vol. 55 Issue 08
KEYWORDS: Mirrors, Interferometers, Beam splitters, Reflection, Michelson interferometers, Collimation, Interferometry, Optical engineering, Wavefronts, Turbulence

SPIE Journal Paper | July 23, 2015
OE Vol. 54 Issue 07
KEYWORDS: Tolerancing, Monochromatic aberrations, Wavefronts, Photovoltaics, Wavefront sensors, Optical components, Optical testing, Optical engineering, Ray tracing, Wavefront reconstruction

PROCEEDINGS ARTICLE | March 17, 2015
Proc. SPIE. 9417, Medical Imaging 2015: Biomedical Applications in Molecular, Structural, and Functional Imaging
KEYWORDS: Breast, Biomedical optics, Breast cancer, Tumors, Tissues, Ultrasonography, Interferometry, Speckle pattern, Finite element methods, Mammography

SPIE Journal Paper | September 19, 2014
OE Vol. 53 Issue 11
KEYWORDS: Holography, Holographic interferometry, Microscopy, Digital holography, Physics, 3D displays, Metrology, Nondestructive evaluation, LCDs, Computing systems

Showing 5 of 12 publications
Conference Committee Involvement (2)
Interferometry XVII: Techniques and Analysis
17 August 2014 | San Diego, California, United States
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
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