Dr. Angela D. Davies
Professor at Univ of North Carolina at Charlotte
SPIE Involvement:
Senior status | Conference Chair | Conference Program Committee | Author
Publications (34)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Metals, In situ metrology, Inspection, Laser welding, Interferometry, Additive manufacturing, Projection systems, Laser manufacturing

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Telescopes, Mirrors, Segmented mirrors, Moire patterns, Fringe analysis, Metrology, Cameras, Interferometry, Deflectometry, Optical alignment

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Optical components, Optical design, Scattering, Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Fabrication, Superposition, Polishing, Optical spheres, Spatial frequencies, Germanium, Zernike polynomials, Raster graphics, Freeform optics, Received signal strength

PROCEEDINGS ARTICLE | September 23, 2014
Proc. SPIE. 9223, Remote Sensing System Engineering V
KEYWORDS: Optical sensors, Cameras, Sensors, Calibration, Image processing, Photogrammetry, Monte Carlo methods, Image sensors, Distance measurement, Coded apertures

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Polishing, Metrology, Spatial frequencies, Error analysis, Wavefronts, Adaptive optics, Image quality, Reconstruction algorithms, Freeform optics, Surface finishing

Showing 5 of 34 publications
Conference Committee Involvement (7)
Interferometry XIX
19 August 2018 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Interferometry XIV: Applications
13 August 2008 | San Diego, California, United States
Showing 5 of 7 published special sections
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top