Dr. Angela D. Davies
Professor at Univ of North Carolina at Charlotte
SPIE Involvement:
Senior status | Conference Program Committee | Author
Publications (34)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Additive manufacturing, Projection systems, Metrology, Metals, Laser manufacturing, Laser welding, Inspection, Interferometry, In situ metrology

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Deflectometry, Segmented mirrors, Mirrors, Cameras, Optical alignment, Metrology, Telescopes, Interferometry, Fringe analysis, Moire patterns

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics, Optical components, Optical design, Scattering

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Zernike polynomials, Fabrication, Freeform optics, Received signal strength, Raster graphics, Optical spheres, Germanium, Polishing, Spatial frequencies, Superposition

PROCEEDINGS ARTICLE | September 23, 2014
Proc. SPIE. 9223, Remote Sensing System Engineering V
KEYWORDS: Cameras, Sensors, Monte Carlo methods, Optical sensors, Distance measurement, Coded apertures, Image processing, Image sensors, Photogrammetry, Calibration

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Reconstruction algorithms, Spatial frequencies, Surface finishing, Metrology, Freeform optics, Wavefronts, Error analysis, Polishing, Image quality, Adaptive optics

Showing 5 of 34 publications
Conference Committee Involvement (6)
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Interferometry XIV: Applications
13 August 2008 | San Diego, California, United States
Interferometry XIII: Applications
16 August 2006 | San Diego, California, United States
Showing 5 of 6 published special sections
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