Dr. Angela D. Davies
Professor at Univ of North Carolina at Charlotte
SPIE Involvement:
Senior status | Conference Program Committee | Conference Chair | Editor | Author
Publications (36)

SPIE Conference Volume | October 29, 2018

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Error analysis, Deflectometry, Phase measurement

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Telescopes, Mirrors, Segmented mirrors, Moire patterns, Fringe analysis, Metrology, Cameras, Interferometry, Deflectometry, Optical alignment

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Optical components, Optical design, Scattering, Wavefronts, Zernike polynomials, Modulation transfer functions, Freeform optics

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Metals, In situ metrology, Inspection, Laser welding, Interferometry, Additive manufacturing, Projection systems, Laser manufacturing

PROCEEDINGS ARTICLE | September 26, 2016
Proc. SPIE. 9961, Reflection, Scattering, and Diffraction from Surfaces V
KEYWORDS: Fabrication, Superposition, Polishing, Optical spheres, Spatial frequencies, Germanium, Zernike polynomials, Raster graphics, Freeform optics, Received signal strength

Showing 5 of 36 publications
Conference Committee Involvement (8)
Applied Optical Metrology III
11 August 2019 | San Diego, California, United States
Interferometry XIX
21 August 2018 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Showing 5 of 8 published special sections
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