Anika A. Kinkhabwala
Device Characterization Engineer/Scientist at Solopower Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2003
Proc. SPIE. 4851, X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy
KEYWORDS: X-ray optics, Roentgenium, Sensors, Calibration, X-rays, Spectrometers, Charge-coupled devices, Neon, Plasma, Absorption

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