Dr. Anis Meguenani
at IUT de Mulhouse - Campus Collines
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 July 2019
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Light sources, 3D image reconstruction, Defect detection, Cameras, Sensors, Calibration, Inspection, Deflectometry

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