Annalisa Pepe
at STMicroelectronics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 28 May 2004 Paper
Pietro Cantu, Gianfranco Capetti, Sara Loi, Marco Lupo, Annalisa Pepe, Kenji Saitoh, Kenji Yamazoe, Yasuo Hasegawa, Junji Iwasa, Olivier Toublan
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.534065
KEYWORDS: Monochromatic aberrations, Printing, Photomasks, Optical proximity correction, Scanners, Binary data, Resolution enhancement technologies, Lithography, Spherical lenses, Visualization

Proceedings Article | 28 May 2004 Paper
Gianfranco Capetti, Maddalena Bollin, Annalisa Pepe, Gina Cotti, Sara Loi, Umberto Iessi
Proceedings Volume 5377, (2004) https://doi.org/10.1117/12.533707
KEYWORDS: Diffraction, Binary data, Photomasks, Lithographic illumination, Lithography, Nanoimprint lithography, Scanners, Semiconducting wafers, Resolution enhancement technologies, Edge roughness

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