Dr. Anne Bonnin
at Paul Scherrer Institut
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microscopes, Phase contrast, Sensors, X-rays, Image resolution, Quantitative analysis, Image quality, Detector development, Objectives, Zone plates, X-ray imaging, Hard x-rays, Alignment procedures

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top