Dr. Anne Fornier
at CEA
SPIE Involvement:
Publications (17)

Proceedings Article | 23 July 1999 Paper
Daniel Schirmann, Luc Bianchi, Roger Courchinoux, Anne Fornier, Henry Jaquet, Francois Jequier, Alain Geille, Jean Gomme, Thierry Lonjaret
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354185
KEYWORDS: X-rays, Fusion energy, Contamination, Ions, Boron, X-ray optics, Gold, Aluminum, Silica, Environmental sensing

Proceedings Article | 23 July 1999 Paper
Francois Genin, Alexander Rubenchik, Alan Burnham, Michael Feit, J. Yoshiyama, Anne Fornier, C. Cordillot, Daniel Schirmann
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354235
KEYWORDS: Silica, Contamination, Metals, Copper, Absorption, Thin films, Gold, Aluminum, Laser damage threshold, Laser induced damage

Proceedings Article | 23 July 1999 Paper
Anne Fornier, D. Bernardino, Odile Lam, Jerome Neauport, Francois Dufour, Bernard Schmitt, Jean-Marie Mackowski
Proceedings Volume 3492, (1999) https://doi.org/10.1117/12.354213
KEYWORDS: Mirrors, Manufacturing, Laser damage threshold, Laser scattering, Scattering, Absorption, Sputter deposition, Ion beams, Contamination, Scatter measurement

Proceedings Article | 7 April 1999 Paper
Anne Fornier, Philippe Feru, B. Pinot, Herve Leplan, G. Leroux, Scott Burkhart, Timothy Weiland
Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344454
KEYWORDS: Mirrors, Optical components, Laser damage threshold, Laser optics, Coating, Polarizers, Laser welding, Optical testing, Hybrid fiber optics

Proceedings Article | 7 April 1999 Paper
Christelle Dubern, J.-L. Bruneel, Patrick Chadeyron, C. Cordillot, M. Couzi, Anne Fornier, Pierre Joubert, Daniel Schirmann
Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344379
KEYWORDS: Particles, Boron, Carbon, Photography, Laser induced damage, Reflectivity, Silica, Vitreous, Scanning electron microscopy, Laser damage threshold

Showing 5 of 17 publications
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