Dr. Annette Hultaker
at Fraunhofer IOF
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 25 February 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Polishing, Scattering, Silicon, Light scattering, Optical coatings, Atomic force microscopy, Vacuum ultraviolet, Scatter measurement, Autoregressive models, Surface finishing

Proceedings Article | 25 February 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Optical spheres, Deep ultraviolet, Backscatter, Scattering, Light scattering, Reflectivity, Transmittance, Vacuum ultraviolet, Scatter measurement, Autoregressive models

Proceedings Article | 4 November 2003
Proc. SPIE. 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies
KEYWORDS: Backscatter, Scattering, Light scattering, Optical coatings, Reflectivity, Atomic force microscopy, Transmittance, Vacuum ultraviolet, Thin film coatings, Scatter measurement

Proceedings Article | 30 May 2003
Proc. SPIE. 4932, Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
KEYWORDS: Optical components, Scattering, Laser induced damage, Reflectivity, Surface roughness, Dysprosium, Vacuum ultraviolet, Laser optics, Scatter measurement, Ruthenium

Proceedings Article | 19 November 2001
Proc. SPIE. 4590, BioMEMS and Smart Nanostructures
KEYWORDS: Near infrared, Thin films, Optical properties, Glasses, Annealing, Particles, Coating, Transmittance, Thin film coatings, Absorption

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