Prof. Anthony T. S. Ho
Deputy Head of Department at University of Surrey
SPIE Involvement:
Publications (12)

Proceedings Article | 5 May 2010 Paper
Proc. SPIE. 7723, Optics, Photonics, and Digital Technologies for Multimedia Applications
KEYWORDS: Statistical analysis, Image compression, Image processing, Digital watermarking, Discrete wavelet transforms, JPEG2000, Image quality, Digital imaging, Quantization, Image forensics

SPIE Journal Paper | 1 April 2009
JEI Vol. 18 Issue 02
KEYWORDS: Digital watermarking, Image segmentation, Binary data, Holmium, Image compression, Distortion, Image processing, Sensors, Image restoration, Image quality

SPIE Journal Paper | 1 November 2004
OE Vol. 43 Issue 11
KEYWORDS: Holograms, Image encryption, Fourier transforms, Diffractive optical elements, Binary data, Microfabrication, Image restoration, Lithography, Optical alignment, Computer security

Proceedings Article | 23 June 2003 Paper
Proc. SPIE. 5150, Visual Communications and Image Processing 2003
KEYWORDS: Image compression, Visualization, Data hiding, Matrices, Image processing, Wavelets, Digital watermarking, Discrete wavelet transforms, Image quality, Image retrieval

Proceedings Article | 30 January 2003 Paper
Proc. SPIE. 4793, Mathematics of Data/Image Coding, Compression, and Encryption V, with Applications
KEYWORDS: Optical filters, Satellites, Digital filtering, Linear filtering, Digital watermarking, Satellite imaging, Gaussian filters, Image filtering, Electronic filtering, Earth observing sensors

Showing 5 of 12 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 18 August 1997

Conference Committee Involvement (6)
Media Watermarking, Security, and Forensics 2015
9 February 2015 | San Francisco, California, United States
Media Watermarking, Security, and Forensics 2014
3 February 2014 | San Francisco, California, United States
Media Watermarking, Security, and Forensics 2013
5 February 2013 | Burlingame, California, United States
Bogus Conference--Organizing/Advisory Committee
29 November 1999 | Singapore, Singapore
Automatic Inspection and Novel Instrumentation
25 June 1997 | Singapore, Singapore
Showing 5 of 6 Conference Committees
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