Dr. Antoine Laurent
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2020 Presentation + Paper
Proceedings Volume 11352, 113520R (2020) https://doi.org/10.1117/12.2556545
KEYWORDS: Speckle, Digital holography, Databases, Error analysis, Signal to noise ratio, Optical metrology, Holography, Image processing, Denoising, Fringe analysis

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