Anton J. Tremmel
Student at Technical University of Munich
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 5 May 2017
Proc. SPIE. 10210, Next-Generation Spectroscopic Technologies X
KEYWORDS: Microbolometers, Thermography, Optical components, Fourier spectroscopy, Refractive index, Beam splitters, FT-IR spectroscopy, Data modeling, Sensors, Spectroscopy, Spectrometers, Fourier transforms, Infrared spectroscopy, Detector arrays, Infrared radiation, Spectrometer engineering, Temperature metrology

Proceedings Article | 28 April 2017
Proc. SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017
KEYWORDS: Hyperspectral imaging, Thin films, Reflection, Imaging systems, Polymers, Reflectivity, Computer simulations, Reflectometry, Neural networks, Neurons

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Beam splitters, Imaging systems, Sensors, Image processing, Luminescence, Image resolution, Image filtering, Aluminum, 3D image processing, Bandpass filters

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top