Antonela Comisso
at Univ degli Studi di Padova
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | September 14, 2016
OE Vol. 55 Issue 09
KEYWORDS: Titanium dioxide, Reflectivity, Titanium, Thin films, Silicon, X-rays, Statistical modeling, Contamination, Interfaces, Extreme ultraviolet

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Thin films, Refractive index, X-ray optics, Titanium, Titanium dioxide, X-rays, Silicon, Reflectivity, Surface roughness, Extreme ultraviolet

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Multilayers, X-rays, Interfaces, Diffusion, Reflectivity, Scanning electron microscopy, Extreme ultraviolet, Boron, Extreme ultraviolet lithography, Grazing incidence

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top