Prof. Antonio Pietrosanto
at Univ degli Studi di Salerno
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 January 2007
Proc. SPIE. 6491, Videometrics IX
KEYWORDS: Metrology, Statistical analysis, 3D acquisition, Optical spheres, Scanners, Error analysis, Clouds, 3D metrology, 3D scanning, Standards development

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