The imaging and digital processing of anisotropic optical properties of in vivo skin may be helpful in the assessment of its heterogeneous anatomy and physiological functioning. The interaction between polarized light and this organ provides information about the structural order beneath the epidermal layer. However, penetration depth is limited by optical absorption and scattering that are related to local skin characteristics such as pigment density, connective tissue organization, and cutaneous layer thickness. In this work, in vivo healthy skin of a murine model was analyzed using Mueller imaging polarimetry. A gray-level co-occurrence matrix analysis of diattenuation, birefringence, and depolarization measures in four different skin locations showed texture properties that can be used to distinguish local physiology.
In this work forward and inverse solutions for two-element Risley prism for pointing and scanning beam systems are developed. A more efficient and faster algorithm is proposed to make an analogy of the Risley prism system compared with a robotic system with two degrees of freedom. This system of equations controls each Risley prism individually as a planar manipulator arm of two links. In order to evaluate the algorithm we implement it in a pointing system. We perform popular routines such as the linear, spiral and loops traces. Using forward and inverse solutions for two-element Risley prism it is also possible to point at coordinates specified by the user, provided they are within the pointer area of work area. Experimental results are showed as a validation of our proposal.
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Photovoltaics, Prisms, Solar energy, Solar concentrators, Imaging systems, Cameras, Solar cells, Inspection, Control systems, Optical fabrication, Optical alignment, Fresnel lenses, Solar energy systems
We designed, developed, fabricated, and tested an opto-electronic system to test alignment of CPV solar system
modules that is portable and robust to implement as a step in the assembly line. In addition to the components used
in systems employed previously, we implement a thin prism in four orientations in a plane normal to optical axis of
the unit under test. Its advantage is robustness against its positioning and orientation errors.
In this work, theory and experiment describe the performance of a surface profile measurement device based on optical heterodyne interferometry are presented. The object and reference beams propagating through the interferometer are obtained by single-pass through an acousto-optic modulator. The diffraction orders 0 and the Doppler-shifted +1 (object and reference beams, respectively) are manipulated to propagate collinearly towards the interferometer output where a fast photodetector is placed to collect the irradiance. The modulated optical signal is Fourier transformed using a data acquisition card and RF communications software. The peak centered at the acousto-optic frequency in the power spectrum is filtered and averaged. The irregularities on the surface of the reflective sample are proportional to the height of this peak. The profile of a reflective blazed grating has been sketched by translating laterally the sample using a nanopositioning system. Experimental results are compared to the measurement done with a scanning electron microscope. There has been found a good agreement between both methods.