Dr. Armand Pruijmboom
at Fluke Nederland BV
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 12 February 2009
Proc. SPIE. 7221, Photonics Packaging, Integration, and Interconnects IX
KEYWORDS: Wafer-level optics, Interferometers, Sensors, Gallium arsenide, Silicon, Laser scattering, Lens design, Integrated optics, Vertical cavity surface emitting lasers, Semiconducting wafers

Proceedings Article | 29 January 2008
Proc. SPIE. 6908, Vertical-Cavity Surface-Emitting Lasers XII
KEYWORDS: Modulation, Doppler effect, Sensors, Light scattering, Laser applications, Laser scattering, Speckle pattern, Vertical cavity surface emitting lasers, Laser optics, Signal detection

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